The book focuses on the introduction of solid surface quantitative analysis, and pays attention to its application in film growth kinetics. The book Surface Analysis of Reflection High Energy Electron Diffraction During Film Growth is divided into seven chapters.
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Anbieter: liu xing, Nanjing, JS, China
paperback. Zustand: New. Language:Chinese.Surface analysis of reflection high energy electron diffraction in thin film growth. Artikel-Nr. MX5284
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