Analytical Electron Microscopy for Materials Science - Softcover

Shindo, DAISUKE; Oikawa, T.

 
9784431703365: Analytical Electron Microscopy for Materials Science
Softcover
ISBN 10: 4431703365 ISBN 13: 9784431703365
Verlag: Springer, 2002

Inhaltsangabe

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

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Verlag
Springer
Erscheinungsdatum
2002
Sprache
Englisch
ISBN 10 
4431703365
ISBN 13 
9784431703365
Einband
Taschenbuch
Anzahl der Seiten
161
Kontakt zum Hersteller
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Poststr. 9
Darmstadt
64293
Deutschland

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9784431669890: Analytical Electron Microscopy for Materials Science

Vorgestellte Ausgabe

ISBN 10:  4431669892 ISBN 13:  9784431669890
Verlag: Springer, 2014
Softcover