Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Artikel-Nr. ria9783642844072_new
Anzahl: Mehr als 20 verfügbar
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Paperback. Zustand: Brand New. reprint edition. 378 pages. 6.06x5.83x0.16 inches. In Stock. Artikel-Nr. x-3642844073
Anzahl: 2 verfügbar
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design. Artikel-Nr. 9783642844072
Anzahl: 1 verfügbar