Verwandte Artikel zu Near-Field Characterization of Micro/Nano-Scaled Fluid...

Near-Field Characterization of Micro/Nano-Scaled Fluid Flows (Experimental Fluid Mechanics) - Softcover

 
9783642267376: Near-Field Characterization of Micro/Nano-Scaled Fluid Flows (Experimental Fluid Mechanics)

Inhaltsangabe

The near-field region within an order of 100 nm from the solid interface is an exciting and crucial arena where many important multiscale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, binding of bio-molecules, crystallization, surface deposition processes, just naming a few. This monograph presents a number of label-free experimental techniques developed and tested for near-field fluid flow characterization. Namely, these include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Surface Plasmon Resonance Microscopy (SPRM), Interference Reflection Contrast Microscopy (IRCM), Thermal Near-Field Anemometry, Scanning Thermal Microscopy (STM), and Micro-Cantilever Near-Field Thermometry. Presentation on each of these is laid out for the working principle, how to implement the system, and its example applications, to promote the readers understanding and knowledge of the specific technique that can be applied for their own research interests.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Über die Autorin bzw. den Autor

The near-field – the region within 100 nm from a solid interface - is an exciting arena in which several important multi-scale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, the binding of bio-molecules, crystallization, and surface deposition processes, just to name a few. This book presents a number of microscopicimaging techniques that were implemented and tested for near-field fluidic characterizations. These methods include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Confocal Laser Scanning Microscopy (CLSM), Surface Plasmon Resonance Microscopy (SPRM), and Reflection Interference Contrast Microscopy (RICM). The basic principles, specifics of implementation, and example applications of each method are presented in order to promote the reader’s understanding of the techniques, so that these may be applied to their own research interests.

Von der hinteren Coverseite

<p>The near-field – the region within 100 nm from a solid interface - is an exciting arena in which several important multi-scale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, the binding of bio-molecules, crystallization, and surface deposition processes, just to name a few. This book presents a number of microscopicimaging techniques that were implemented and tested for near-field fluidic characterizations. These methods include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Confocal Laser Scanning Microscopy (CLSM), Surface Plasmon Resonance Microscopy (SPRM), and Reflection Interference Contrast Microscopy (RICM). The basic principles, specifics of implementation, and example applications of each method are presented in order to promote the reader’s understanding of the techniques, so that these may be applied to their own research interests.</p>

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Gratis für den Versand innerhalb von/der Deutschland

Versandziele, Kosten & Dauer

Weitere beliebte Ausgaben desselben Titels

9783642204258: Near-Field Characterization of Micro/Nano-Scaled Fluid Flows (Experimental Fluid Mechanics)

Vorgestellte Ausgabe

ISBN 10:  3642204252 ISBN 13:  9783642204258
Verlag: Springer, 2011
Hardcover

Suchergebnisse für Near-Field Characterization of Micro/Nano-Scaled Fluid...

Foto des Verkäufers

Kenneth D Kihm
ISBN 10: 3642267378 ISBN 13: 9783642267376
Neu Softcover

Anbieter: moluna, Greven, Deutschland

Verkäuferbewertung 4 von 5 Sternen 4 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Zustand: New. Artikel-Nr. 5054783

Verkäufer kontaktieren

Neu kaufen

EUR 92,27
Währung umrechnen
Versand: Gratis
Innerhalb Deutschlands
Versandziele, Kosten & Dauer

Anzahl: Mehr als 20 verfügbar

In den Warenkorb

Foto des Verkäufers

Kenneth D Kihm
ISBN 10: 3642267378 ISBN 13: 9783642267376
Neu Taschenbuch

Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland

Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The near-field region within an order of 100 nm from the solid interface is an exciting and crucial arena where many important multiscale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, binding of bio-molecules, crystallization, surface deposition processes, just naming a few. This monograph presents a number of label-free experimental techniques developed and tested for near-field fluid flow characterization. Namely, these include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Surface Plasmon Resonance Microscopy (SPRM), Interference Reflection Contrast Microscopy (IRCM), Thermal Near-Field Anemometry, Scanning Thermal Microscopy (STM), and Micro-Cantilever Near-Field Thermometry. Presentation on each of these is laid out for the working principle, how to implement the system, and its example applications, to promote the readers understanding and knowledge of the specific technique that can be applied for their own research interests. Artikel-Nr. 9783642267376

Verkäufer kontaktieren

Neu kaufen

EUR 106,99
Währung umrechnen
Versand: Gratis
Innerhalb Deutschlands
Versandziele, Kosten & Dauer

Anzahl: 1 verfügbar

In den Warenkorb

Beispielbild für diese ISBN

Kihm, Kenneth D
Verlag: Springer, 2014
ISBN 10: 3642267378 ISBN 13: 9783642267376
Neu Softcover

Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich

Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Zustand: New. In. Artikel-Nr. ria9783642267376_new

Verkäufer kontaktieren

Neu kaufen

EUR 110,86
Währung umrechnen
Versand: EUR 5,69
Von Vereinigtes Königreich nach Deutschland
Versandziele, Kosten & Dauer

Anzahl: Mehr als 20 verfügbar

In den Warenkorb

Beispielbild für diese ISBN

Kihm, Kenneth D (Author)
Verlag: Springer, 2014
ISBN 10: 3642267378 ISBN 13: 9783642267376
Neu Paperback

Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich

Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Paperback. Zustand: Brand New. 2011 edition. 156 pages. 9.25x6.10x0.39 inches. In Stock. Artikel-Nr. x-3642267378

Verkäufer kontaktieren

Neu kaufen

EUR 149,49
Währung umrechnen
Versand: EUR 11,43
Von Vereinigtes Königreich nach Deutschland
Versandziele, Kosten & Dauer

Anzahl: 2 verfügbar

In den Warenkorb