Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48, Band 48) - Hardcover

Buch 2 von 30: Springer Series in Surface Sciences
 
9783642225659: Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48, Band 48)

Inhaltsangabe

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

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In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

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9783642271137: Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, Band 48)

Vorgestellte Ausgabe

ISBN 10:  3642271138 ISBN 13:  9783642271137
Verlag: Springer, 2013
Softcover