A wide-ranging description of recent progress and new approaches for researchers and graduate students in microscopy and materials science.
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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
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Taschenbuch. Zustand: Neu. Progress in Transmission Electron Microscopy 2 | Applications in Materials Science | Xiao-Feng Zhang (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2010 | Springer | EAN 9783642087189 | Verantwortliche Person für die EU: Lauinger, Sonia, Sonia Lauinger, Lauinger Verlag, Heinrich-Köhler-Platz 8, 76187 Karlsruhe, mail[at]lauinger-verlag[dot]de | Anbieter: preigu. Artikel-Nr. 107123591
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Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes. Artikel-Nr. 9783642087189
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Zustand: New. In. Artikel-Nr. ria9783642087189_new
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