Verwandte Artikel zu Applied Scanning Probe Methods VIII: Scanning Probe...
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Hardcover
Inhaltsangabe
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Reseña del editor
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
EUR 13,65
EUR 5,91 für den Versand von Vereinigtes Königreich nach Deutschland
Versandziele, Kosten & DauerNeu kaufen
Diesen Artikel anzeigen
EUR 47,90
Gratis für den Versand von USA nach Deutschland
Versandziele, Kosten & Dauer
Suchergebnisse für Applied Scanning Probe Methods VIII: Scanning Probe...
Foto des Verkäufers
Ubiquitous Positioning (Artech House Mobile Communications)
Anbieter: WeBuyBooks, Rossendale, LANCS, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: Like New. Most items will be dispatched the same or the next working day. An apparently unread copy in perfect condition. Dust cover is intact with no nicks or tears. Spine has no signs of creasing. Pages are clean and not marred by notes or folds of any kind. Artikel-Nr. wbs2629180946
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Applied Scanning Probe Methods Viii: Scanning Probe Microscopy Techniques (Nanoscience And Technology)
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-1229
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
Verlag:
Springer Berlin Heidelberg, 2008
ISBN 10: 3540740791
ISBN 13: 9783540740797
Gebraucht
Hardcover
Anbieter: Buchpark, Trebbin, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Zustand: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher. Artikel-Nr. 3926271/1
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
Verlag:
Springer Berlin Heidelberg, 2008
ISBN 10: 3540740791
ISBN 13: 9783540740797
Gebraucht
Hardcover
Anbieter: Buchpark, Trebbin, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. Artikel-Nr. 3926271/12
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Appllied Scanning Probe Methods Viii
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-261225
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Applied Scanning Probe Methods Viii: Scanning Probe Microscopy Techniques
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-82675
Anzahl: 1 verfügbar
Foto des Verkäufers
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics. Artikel-Nr. 9783540740797
Anzahl: 1 verfügbar
Foto des Verkäufers
Applied Scanning Probe Methods VIII
ISBN 10: 3540740791
ISBN 13: 9783540740797
Neu
Hardcover
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Neuware -The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 528 pp. Englisch. Artikel-Nr. 9783540740797
Anzahl: 2 verfügbar
Beispielbild für diese ISBN
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. In. Artikel-Nr. ria9783540740797_new
Anzahl: Mehr als 20 verfügbar
Beispielbild für diese ISBN
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Brand New. 1st edition. 465 pages. 9.50x6.50x1.00 inches. In Stock. Artikel-Nr. x-3540740791
Anzahl: 2 verfügbar