High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics Vol. 149): High Resolution X-Ray Scattering from ... Ergebnisse der exakten Naturwissenschaften) - Hardcover

Inhaltsangabe

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.