Springer Handbook of Materials Measurement Methods - Hardcover

Über die Autorin bzw. den Autor

Dr. Horst Czichos is Professor of Mechatronics at the University of Applied Sciences, Berlin, Germany. He graduated with a degree in Precision Engineering and worked as a design engineer in the optical industry. He holds Dipl.-Phys. and Dr.-Ing (Materials Science) degrees from the Free and Technical Universities of Berlin and a Dr. h.c. from KU Leuven. He was President of the German Federal Institute for Materials Research and Testing (BAM) from 1992 to 2002 and President of the European Federation of National Associations of Measurement, Testing and Analytical Laboratories, EUROLAB (1999 – 2003), and is now its Delegate for the International Affiliates.

Dr. Saito is currently Senior Adviser Emeritus at the National Institute for Materials Science (NIMS) and Chairman of ISO/TC164 (Mechanical Testing of Metals). He received his Dr.-Eng from the University of Tokyo in 1978 and since has held various positions at the National Research Institute for Metals, including Director of Materials Evaluation Division and Deputy Director-General of the Institute.

After retirement from his position as Director of the Materials Science and Engineering Laboratory of the National Institute of Standards and Technology (NIST) Dr. Leslie Smith is a Research Associate at NIST. He received B.S. and Ph.D. degrees from Case Institute of Technology and the Catholic University of America in physical-organic chemistry and conducted research primarily on the adsorption of polymers and the degradation of polyesters.

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There is no science without measurements, no quality without testing, and no global markets without standards. (Commission of the European Union) This Springer Handbook of Materials Measurement Methods compiles advanced methods for materials measurement and characterization from the macroscopic to the nanometer scale. Materials science and its industrial applications require the highest level of accuracy and reliability in the measurement of the properties of materials and the assessment of their safety and reliability. Major technological nations fund large laboratories for testing and measurements that set standards, assess the safety and reliability of materials, and oversee the use of dangerous materials. Behind and beyond the data themselves are the underlying methods whose sophistication and proper use are absolutely necessary to achieve the accuracy, reliability, and safety required by modern technologies. Additionally, the acceleration of the design and creation of new materials via techniques such as molecular modeling and simulation, especially on the nanometer scale, makes the measurement of new materials properties and their characterization ever more critical. Materials professionals will find clear guidelines and standards for how to measure the full spectrum of materials characteristics of new materials and systems. Since materials science forms a bridge between the more traditional fields of physics, engineering, and chemistry, unifying the varying perspectives and covering the full gamut of properties also serves a useful purpose. This Springer Handbook is the first dedicated to these practical and important considerations. Key Topics Measurement Principles and Structures Measurement Strategy and Quality Measurement Methods for Composition and Structure: Chemical Composition, Nanoscopic Architecture and Microstructure, Surface and Interface Characterization Measurement Methods for Materials Properties: Mechanical, Thermal, Electrical, Magnetic, Optical Measurement Methods for Materials Performance: Corrosion, Friction and Wear, Biogenic Impact, Materials–Environment Interactions, Performance Control and Condition Monitoring Modeling and Simulation Methods International Standards Features Develops and explains clear guidelines and standards for the measurement of materials and systems characteristics Incorporates over 50 pages with latest international standards referenced in chapters (AATCC, ANSI, AS, ASTM, AWPA, BSI, DIN, EN, IEC, ISO, JIS, NF. OIML, SEP, SN, VDI) Guarantees quick access to data through parts and chapters with summaries, detailed index, and fully searchable CD-ROM Contains over 500 two-color illustrations and over 50 comprehensive tables Delivers a wealth of up-to-date references