Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications - Softcover

Inhaltsangabe

A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization

In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems.

The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes:

• Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites
• Comprehensive explorations of two-dimensional transition metal dichalcogenides
• Practical discussions of single layer graphene systems and nickelate systems
• In-depth examinations of potential future developments and applications of spectroscopic ellipsometry

Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

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