Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems) - Hardcover

 
9783527314942: Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems)
Hardcover
ISBN 10: 3527314946 ISBN 13: 9783527314942
Verlag: Blackwell Verlag GmbH, 2007

Inhaltsangabe

This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. Divided into two major parts, following a general introductory chapter to reliability issues, the first part looks at the mechanical properties of the materials used in MEMS, explaining in detail the necessary measuring technologies -- nanoindenters, bulge methods, bending tests, tensile tests, and others. Part Two treats the actual devices, organized by important device categories such as pressure sensors, inertial sensors, RF MEMS, and optical MEMS.

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Über die Autorin bzw. den Autor

Osamu Tabata received his Ph.D. degree from Nagoya Institute of Technology, Japan, in 1993. From 1981 to 1996, he performed industrial research at Toyota Central Research and Development Laboratories in Aichi, Japan. He then joined the Department of Mechanical Engineering of Ritsumeikan University in Shiga, Japan, and spent Guest Professorships at IMTEK Freiburg, Germany, and at ETH Zurich, Switzerland. In 2003, he joined the Kyoto University, Japan. Currently, he is the Professor at Micro Engineering Department. Professor Tabata is engaged in the research of micro/nano processes, MEMS and micro/nano system synthetic engineering (SENS). He was honored with the Science News Award in 1987, Presentation Paper Award in 1992, and received the R&D 100 Award in 1993 and 1998, Best Poster Award of 19th Sensor Symposium on Sensors, Micromachines, and Applied Systems in 2002, Best Patent Award from Ritsumeikan University in 2004. He is a senior member of the Institute of Electrical Engineers of Japan, a member of the Japan Society of Mechanical Engineers and a senior member of the Institute of Electrical and Electronics Engineers.

Toshiyuki Tsuchiya received his Ph.D. degree from Nagoya University, Japan, in 2002. From 1993 to 2004, he carried out industrial research at Toyota Central Research and Development Laboratories in Aichi, Japan. In 2004, he joined the Department of Mechanical Engineering of Kyoto University and is currently Associate Professor in the Department of Microengineering. Toshiyuki Tsuchiya's current research is focused on mechanical properties evaluation of micro/nano materials and MEMS and micro/nano system synthetic engineering (SENS). He received the R&D 100 Award in 1998.

Von der hinteren Coverseite

The gateway to the micro and nano worlds: Advanced Micro &amp; Nano-systems (AMN) provides cutting-edge reviews and detailed case studies by top authors from science and industry, covering technologies, devices and advanced system from the micro and nano worlds, which together have an immense innovative application potential that opens up with control of shape and function from the atomic level right up to the visible world without any technological gaps. <p>In this topical volume, one of the most important hurdles to commercialization for microelectromechanical systems is covered in detail: the reliability of MEMS materials&#160;and devices. Due to their microscale size combined with novel functionalities, a whole new category of challenges arises, and proper determination of a given device's reliability is instrumental in determining its range of usability and application fields. Any kind of gadget's performance, lifetime and safety will depend on the continued and predictable functioning of both the electronic as well as the micromechanical parts. MEMS reliability therefore can be as serous as human life-and-death matters - quite literally in the case of roll-over sensors for cars, for example.</p>

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Verlag
Blackwell Verlag GmbH
Erscheinungsdatum
2007
Sprache
Englisch
ISBN 10 
3527314946
ISBN 13 
9783527314942
Einband
Tapa dura
Anzahl der Seiten
324
Herausgeber
Tabata Osamu, Tsuchiya Toshiyuki
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar

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9783527335015: Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems)

Vorgestellte Ausgabe

ISBN 10:  3527335013 ISBN 13:  9783527335015
Verlag: Blackwell Verlag GmbH, 2013
Softcover