Verwandte Artikel zu Learning from VLSI Design Experience
Inhaltsangabe
This book shares with readers practical design knowledge gained from the author’s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorin bzw. den Autor
Weng Fook Lee is a distinguished Technical Director at Emerald Systems Design Center with 25 years of IC Design experience. Lee has vast experience in designing with Verilog and VHDL, and is an internationally acknowledged expert in the field of RTL coding and logic synthesis for ASIC/FPGA/SOC. Lee is an expert in synthesizing and tweaking synthesis for performance and low power, leading enhanced methodology to address advanced DFT techniques for VDSM technology, development and deployment of low power standard cell libraries. Lee have lead the development of new architectures and micro-architectures for efficient PMSM motion control ASIC and have developed architectures for AI classification algorithms implementation in ASIC. Lee published “VHDL Coding and Logic Synthesis with Synopsys" with Academic Press Publication, US (ISBN: 0-12-440651-3) in May 2000, "Verilog Coding for Logic Synthesis" with John Wiley Publication, US (ISBN: 0-471-42976-7) in April 2003, “VLIW Microprocessor Hardware Design for ASICs and FPGA” with McGraw Hill Publication, US (ISBN: 978-0071497022) in Aug 2007. Lee is also the inventor and co-inventor of 14 design patents granted by the US Patent and Trademark Office.
Von der hinteren Coverseite
This book shares with readers practical design knowledge gained from the author’s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.
- Addresses practical design issues and their workarounds;
- Discusses issues such as CDC, crossing clock domain in shift, scan chains across power domain, timing optimization, standard cell library influence on synthesis, DFT, code coverage, state machine;
- Provides readers with an RTL coding guideline, based on real experience.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Neu kaufen
Diesen Artikel anzeigen
EUR 140,02
EUR 13,75 für den Versand von Vereinigtes Königreich nach USA
Versandziele, Kosten & DauerSuchergebnisse für Learning from VLSI Design Experience
Beispielbild für diese ISBN
Learning from VLSI Design Experience.
Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Deutschland
Verkäuferbewertung 5 von 5 Sternen
XXIX, 214 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. Artikel-Nr. 4334CB
Anzahl: 2 verfügbar
Beispielbild für diese ISBN
Learning from VLSI Design Experience
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. In. Artikel-Nr. ria9783030032371_new
Anzahl: Mehr als 20 verfügbar
Foto des Verkäufers
Learning from VLSI Design Experience
ISBN 10: 303003237X
ISBN 13: 9783030032371
Neu
Hardcover
Signiert
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Neuware -This book shares with readers practical design knowledge gained from the author¿s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch. Artikel-Nr. 9783030032371
Anzahl: 2 verfügbar
Foto des Verkäufers
Learning from VLSI Design Experience
Verlag:
Springer International Publishing, 2019
ISBN 10: 303003237X
ISBN 13: 9783030032371
Neu
Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book shares with readers practical design knowledge gained from the author's 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds. Artikel-Nr. 9783030032371
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Learning from Vlsi Design Experience
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Brand New. 246 pages. 9.25x6.10x0.75 inches. In Stock. Artikel-Nr. x-303003237X
Anzahl: 2 verfügbar
Beispielbild für diese ISBN
Learning From Vlsi Design Experience
Anbieter: Kennys Bookstore, Olney, MD, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. Artikel-Nr. V9783030032371
Anzahl: 15 verfügbar