This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.
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Sebastian, M. T.; Krishna, P.
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Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,950grams, ISBN:2881249256. Artikel-Nr. 9645827
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Anbieter: Hay-on-Wye Booksellers, Hay-on-Wye, HEREF, Vereinigtes Königreich
Zustand: Very Good. Light scratches and marks to the cover. Signature to the inside cover. The book is fine to read throughout, very clean. Artikel-Nr. 139932a
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