Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling. This is the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to: instrumentation and sample handling (three chapters); fundamentals and molecular dynamics simulations (four chapters); optimisation methods, including laser post-ionisation of sputtered neutrals (six chapters); data interpretation (two chapters), and analytical applications (eleven chapters). All the contributors are internationally recognised as leaders in their respective fields and come from both Europe and the USA.
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