This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.
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Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).
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EUR 11,90 für den Versand von Vereinigtes Königreich nach Deutschland
Versandziele, Kosten & DauerAnbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 2nd edition. 308 pages. 9.50x6.50x1.00 inches. In Stock. Artikel-Nr. __1857180267
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