Über die Autorin bzw. den Autor

Professor Alan Michette did his PhD in Particle Physics at University College London. After a postdoctoral appointment at UCL he spent four years at the Rutherford Appleton Laboratory before joining Queen Elizabeth College, London as a lecturer, at which point he changed to his current research field of X-Ray Physics. Following the merger of the colleges he moved to King's College London, where he has been ever since apart from a sabbatical in Germany as an Alexander von Humboldt Fellow. In addition to his main research interests, he is the UK instigator of a project to place cosmic ray detectors in local schools with the aim of allowing pupils and teachers the opportunity to be involved in real research - science by application.

Sadly, Professor Michette passed away in May 2013 before this book was published.

Auszug. © Genehmigter Nachdruck. Alle Rechte vorbehalten.

Short Wavelength Laboratory Sources

Principles and Practices

The Royal Society of Chemistry

Contents

Modelling and Simulation, 
ATOMIC AND PLASMA PHYSICS SOFTWARE AND DATABASES FOR THE SIMULATION OF SHORT WAVELENGTH SOURCES F. de Dortan, D. Kilbane, J. Vyskocil, P. Zeitoun, A. Gonzalez, A. de la Varga, O. Guilabaud, D. Portillo, O. Cotelo, A. Barbas and P. Velarde, 3, 
MODELLING OF PLASMA-BASED SEEDED SOFT X-RAY LASERS E. Oliva, T. T. Le and P. Zeitoun, 14, 
FIELD COHERENCE OF EUV SOURCES Olivier Guilbaud, 25, 
REACHABLE EXTREME ULTRAVIOLET WAVELENGTHS ACCORDING TO ELEMENTS / ATOMIC DATA D. Kilbane, F. de Dortan, G. O'Sullivan and V. Zakharov, 42, 
ABSORPTION OF SHORT PUMPING PULSES FOR GRAZING INCIDENCE PUMPED X-RAY LASERS D. Ursescu, 49, 
THEORETICAL ANALYSIS AND EXPERIMENTAL APPLICATIONS OF X-RAY WAVEGUIDES I. Bukreeval, D. Pelliccia, A. Cedola, A. Sorrentino, F. Scarinci, M. Ilie, M. Fratini, V. E. Asadchikov, V. L. Nosik and S. Lagomarsino, 65, 
TABLE-TOP SOFT X-RAY Ar+8 LASERS EXCITED BY CAPILLARY Z-PINCHES J. Szasz, M. Kiss, I. Santa, S. Szatmari, and S.V. Kukhlevsky, 85, 
NANOMETRE SCALE TAPERED PLANAR WAVEGUIDES FOR FOCUSING X-RAY FEMTOSECOND PULSES S.V. Kukhlevsky, 102, 
EXTREME ULTRAVIOLET EMISSION FROM MULTI-CHARGED STATE IONS IN POTASSIUM PLASMAS T. Higashiguchi, B. Li, R D'Arcy, P. Dunne, and Gerry O'Sullivan, 109, 
Source Development, 
LASER PRODUCED PLASMA X-RAY AND EUV SOURCES FOR LITHOGRAPHY G.O'Sullivan, 121, 
PRACTICAL ASPECTS OF XUV GENERATION BY NON-LINEAR FREQUENCY CONVERSION Bill Brocklesby, 131, 
ELECTRON TRAJECTORIES IN HIGH HARMONIC GENERATION I.B. Földes and K. Varjú, 150, 
MODIFIED CATHODE TUBE: X-RAY AND XUV RADIATION FOR NANO-INSPECTION U. Hinze and B. Chichkov, 163, 
CHARACTERISTICS OF A SUB-PICOSECOND TITANIUM Kα SOURCE USING RELATIVISTICALLY INTENSE LASERS U. Zastrau, I. Uschmann, E. Förster, A. Sengebusch, H. Reinholz, G. Röpke, E. Kroupp, E. Stambulchik and Y. Maron, 179, 
BREMSSTRAHLUNG X-RAY EMISSION IN ELECTRON-BEAM-PUMPED KRF LASERS V.D. Zvorykin and S.V. Arlantsev, 207, 
Integrated Systems, 
THE BERN ADVANCED GLASS LASER FOR EXPERIMENT (BEAGLE) X-RAY LASER FACILITY Davide Bleiner and Felix Staub, 235, 
ENEA EXTREME ULTRAVIOLET LITHOGRAPHY MICRO-EXPOSURE TOOL: MAIN FEATURES S. Bollanti, P. Di Lazzaro, F. Flora, L. Mezi, D. Murra, A. Torre, 245, 
CHARACTERISATION AND MITIGATION OF IONS AND PARTICULATE EMITTED BY SOURCES FOR EXTREME ULTRAVIOLET LITHOGRAPHY P. Di Lazzaro, S. Bollanti, F. Flora, L. Mezi, D. Murra and A. Torre, 270, 
EUV MULTILAYER OPTICS: DESIGN, DEVELOPMENT AND METROLOGY P. Nicolosi, 283, 
APPLICATIONS OF KrF LASERS FOR GENERATING COHERENT EUV RADIATION I.B. Földes and S. Szatmári, 313, 
BROADBAND MULTILAYERS: TAILOR MADE MIRRORS FOR LINEARLY POLARIZED X-RAYS FROM A LASER PLASMA SOURCE M. Krämer and K. Mann, 326, 
Applications, 
SHORT WAVELENGTH LABORATORY SOURCES FOR SEMI-CONDUCTOR INSPECTION AND FABRICATION Davide Bleiner and Mabel Ruiz-Lopez, 335, 
CARBON-NANOTUBES FIELD EMITTER TO BE USED IN ADVANCED X-RAY SOURCE M. Fratini, S. Iacobucci, A. Rizzo, F. Scarinci, Y. Zhang, W.I. Milne, A. Cedola, G. Stefani, S. Lagomarsino, 358, 
LASER-PLASMA EUV SOURCE FOR MODIFICATION OF POLYMER SURFACES A. Bartnik, H. Fiedorowicz, R. Jarocki, J. Kostecki, L. Pina, M. Szczurek, and P. Wachulak, 366, 
A SUB-PICOSECOND PLASMA SOURCE FOR TIME-RESOLVED X-RAY MEASUREMENTS T. Kämpfer, S. Höfer, R. Loetzsch, I. Uschmann and E. Förster, 373, 
APPLICATION OF FOCUSED X-RAY BEAMS IN RADIATION BIOLOGY J. Lekki, J. Bielecki, S. Bozek, Z. Stachura, 381, 
TIME-RESOLVED X-RAY DIFFRACTION OF CRYOGENIC SAMPLES USING A LASER BASED PLASMA SOURCE R. Loetzsch, A. Lübcke, F. Zamponi, T. Kämpfer, I. Uschmann and E. Förster, 398, 
NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE MEASUREMENTS USING A LABORATORY-SCALE XUV SOURCE K. Mann, 407, 
NANOMETER SCALE IMAGING USING A DESK-TOP LASER PLASMA EUV SOURCE P.W. Wachulak, A. Bartnik and H. Fiedorowicz, 414, 
LASER-PLASMA EUV AND SOFT X-RAY SOURCES FOR MICROSCOPY APPLICATIONS P.W. Wachulak, A. Bartnik, H. Fiedorowicz, T. Feigl, R. Jarocki, J. Kostecki, L. Pina, M. Szczurek, A. Szczurek and Z. Zawadzki, 419, 
NANOMETER SCALE IMAGING WITH TABLE-TOP EXTREME ULTRAVIOLET LASER P.W. Wachulak, A. Isoyan, R.A. Bartels, C.S. Menoni, J.J. Rocca and M.C. Marconi, 425, 
DEVELOPMENT AND OPTIMIZATION OF LASER-PLASMA EXTREME ULTRAVIOLET AND SOFT X-RAY SOURCES FOR MICROSCOPY APPLICATIONS P. W. Wachulak, A. Bartnik, J. Kostecki, R. Jarocki, M. Szczurek and H. Fiedorowicz, 431, 
Subject Index, 447,