Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics) - Softcover

Stolojan, Vlad

 
9781681740560: Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics)

Inhaltsangabe

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

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University of Surrey, UK

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9781643278025: Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics)

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ISBN 10:  1643278029 ISBN 13:  9781643278025
Verlag: Morgan & Claypool Publishers, 2015
Hardcover