Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint) - Softcover

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Excerpt from Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples

Fortran codes are given which enable the calculation of four-point probe correction factors for use with bar shaped samples. Samples with either plated or unplated ends are considered. The errors that arise due to probe misplacement, inaccurate sample size and shape, and non uniform end plating are also considered. Use of the re sults permits accurate comparison of two-point and four point probe resistivity measurements. The codes are in Fortran II language and were written for an ibm 7090 computer.

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