Scanning Electron Probe Microanalysis (Classic Reprint) - Softcover

Inhaltsangabe

Explore how scanning and spectroscopy come together to map where elements live on a microscopic scale. This reference explains how the electron probe, combined with x-ray spectrometry and scanning techniques, can reveal both the composition and distribution of elements within a specimen. It covers the theory, instrument design, and practical imaging methods that make the device a powerful tool for materials research.

The book describes how a scanning electron probe can function as a microscope sensitive to elemental composition. It shows how different signals—x-rays, target current, backscattered electrons, and cathodoluminescence—can form images and quantitative maps. Readers will learn about pulse recording, expanded contrast, and concentration mapping, as well as how to balance resolution, sensitivity, and background noise. The material emphasizes applying these techniques to real-world samples, from metals to minerals, while noting practical considerations like surface preparation and instrument stability.

• How x-ray emission is used to determine local composition and how image contrast can be enhanced.


• Techniques for turning photon arrivals into quantitative maps of element concentrations.


• How to combine multiple signals and imaging modes to visualize distribution and structure.


• Practical guidance on scan strategies, noise management, and instrument stability for reliable results.

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