Ellipsometry in the Measurement of Surfaces and Thin Films (Classic Reprint): Symposium Proceedings, Washington 1963; Symposium Held September 5-6, ... Standards, Washington, D. C (Classic Reprint) - Softcover

Inhaltsangabe

A concise, field-defining collection on ellipsometry for surfaces and thin films. This volume gathers 20 technical papers from a 1963 symposium, offering both historical context and cutting-edge methods in a single, self-contained reference.

- Learn how ellipsometry measures film thickness and optical constants, and how exact Drude-based equations are applied with modern computing.
- Explore techniques for oxide films, metal surfaces, and adsorption phenomena, including in situ and aqueous environments.
- Review instrumentation advances, computation approaches, and practical applications in metallurgy, corrosion, and solid-state electronics.
- See theoretical developments, experimental sensitivity considerations, and diverse data interpretations through real-world examples.

Ideal for researchers and technicians beginning or advancing work in surface science, thin films, and optical characterization. This edition is a solid foundation for understanding the state of the art and its applications in industry and academia.

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