Floating Gate Devices: Operation and Compact Modeling - Softcover

Inhaltsangabe

Contributing Authors. Preface. Foreword. 1: Introduction. 1. Compact modeling. 2. Semiconductor memories. 3. Floating gate devices. 4. First commercial devices and products. 5. Evolution. 6. Applications and market considerations. References. 2: Principles of floating gate devices. 1. Technology highlights. 2. Cell operation. 3. Disturbs and reliability. References. 3: DC conditions: read. 1. Traditional FG device models. 2. The charge balance model. 3. Simulation results. References. 4: Transient conditions: program and erase. 1. Models proposed in the literature. 2. The charge balance model: the extension transient conditions. 3. Fowler-Nordheim current. 4. Channel hot electron current. References. 5: Further possibilities of FG device compact models. 1. Reliability prediction. 2. Statistics. References. 6: Non volatile memory devices. 1. Basic elements. 2. Main building blocks of the device. 3. Matrix and decoders. 4. Operating modes. 5. DMA test. Acknowledgement. References. Acknowledgements.

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