Soft Errors: From Particles to Circuits (Devices, Circuits, and Systems)

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9781466590830: Soft Errors: From Particles to Circuits (Devices, Circuits, and Systems)
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"Soft Errors: From Particles to Circuits covers all aspects of the design, use, application, performance, and testing of parts, devices, and systems and addresses every perspective from an engineering, scientific, or physical point of view. … Many good texts have been written on similar subjects, but none as thorough, as clear, and as complete as this volume. … [The authors] have mastered the past, absorbed the present, and captured the trends of the future in one of the most important technologies of our time. … An extremely useful text that has succeeded in presenting with clarity a complex reality in accessible, understandable, and helpful terms."
—Epaminondas G. Stassinopoulos, Emeritus, NASA/GSFC, USA

"The few radiation effects books out there are focused on space environments or simply on MOSFET degradation. This book…is focused on the terrestrial environment and goes from basic physics and devices to final product applications, and thus should appeal to a much broader audience than other texts. … This book goes a long way in educating future and existing engineers on how to determine the causes and magnitude of the problems in such systems. … [This book’s strengths are its] focus on the terrestrial environment and the breadth of coverage from particle to device including characterization and modeling techniques."
—Robert Baumann, Texas Instruments, Dallas, USA

Rezension:

"The few radiation effects books out there are focused on space environments or simply on MOSFET degradation. This book…is focused on the terrestrial environment and goes from basic physics and devices to final product applications, and thus should appeal to a much broader audience than other texts. … Soft errors induced from the terrestrial or ground-level radiation environment dominate failures in virtually all electronic systems. In many cases, these failures are uneventful or undetected, but in many critical or largely parallel systems (such as safety systems in planes and cars or network systems or servers with thousands of devices) soft errors are a critical problem that needs to be addressed during the design of the product and system. This book goes a long way in educating future and existing engineers on how to determine the causes and magnitude of the problem in such systems. … [Its strengths are its] focus on the terrestrial environment and the breadth of coverage from particle to device including characterization and modeling techniques."
—Robert Baumann, Texas Instruments, Dallas, USA

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