From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Softcover

Inhaltsangabe

From Contamination to Defects, Faults and Yield Loss Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research an...

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.