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Built-in-Self-Test and Digital Self-Calibration for RF SoCs: 0 (SpringerBriefs in Electrical and Computer Engineering) - Softcover
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This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering)
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Zustand: New. In. Artikel-Nr. ria9781441995476_new
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Verlag:
Springer-Verlag New York Inc., 2011
ISBN 10: 1441995471
ISBN 13: 9781441995476
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Softcover
Anbieter: Kennys Bookstore, Olney, MD, USA
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Zustand: New. This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). Series: SpringerBriefs in Electrical and Computer Engineering. Num Pages: 89 pages, 70 black & white illustrations, 7 black & white tables, biography. BIC Classification: TJFC; UYS. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 5. Weight in Grams: 177. . 2011. 2012. Paperback. . . . . Books ship from the US and Ireland. Artikel-Nr. V9781441995476
Anzahl: 15 verfügbar
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Verlag:
Springer New York, Springer US, 2011
ISBN 10: 1441995471
ISBN 13: 9781441995476
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Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. Artikel-Nr. 9781441995476
Anzahl: 1 verfügbar