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From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
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Críticas
From the reviews:
"The book is a welcome addition to the literature. It is definitely useful as a reference for anyone who is interested in creating test programs for SoC designs. This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields."
(Microelectronics Reliability, 43 (2003)
"CTL for test information of Digital ICs will have significant impact and will be accessible to anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies. The author has done an excellent job. It is a pleasure to read and consult a book that tries to promote understanding, not just coverage. Indeed a stimulating book ... ." (Current Engineering Practice, Vol. 47, 2002-2003)
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From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
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CTL for Test Information of Digital ICs
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
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Zustand: New. pp. 188 Illus. Artikel-Nr. 7548155
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Ctl For Test Information Of Digital Ics (Hb)
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-75737
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Ctl For Test Information Of Digital Ics
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-156061
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CTL for Test Information of Digital ICs
Verlag:
Springer US, Springer US Okt 2002, 2002
ISBN 10: 1402072937
ISBN 13: 9781402072932
Neu
Hardcover
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
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Buch. Zustand: Neu. Neuware -CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL.CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the reader to think like the creators of CTL. Most of the explanations are limited to very simple examples so that the netlist (design) can be drawn out for better visualization of the concepts.There are two types of example CTL syntax in this book. Examples that explain the use of CTL and examples that describe syntax and semantics of the language as it is being introduced.This book should be read by anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch. Artikel-Nr. 9781402072932
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CTL for Test Information of Digital ICs
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL. CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the reader to think like the creators of CTL. Most of the explanations are limited to very simple examples so that the netlist (design) can be drawn out for better visualization of the concepts. There are two types of example CTL syntax in this book. Examples that explain the use of CTL and examples that describe syntax and semantics of the language as it is being introduced. This book should be read by anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies. Artikel-Nr. 9781402072932
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CTL for Test Information of Digital ICs
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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CTL for Test Information of Digital ICS
Anbieter: Kennys Bookstore, Olney, MD, USA
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Zustand: New. From the reviews: "[!] a welcome addition to the literature. [!] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability Num Pages: 173 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 12. Weight in Grams: 444. . 2002. Hardback. . . . . Books ship from the US and Ireland. Artikel-Nr. V9781402072932
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