Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices: 151 (NATO Science Series II: Mathematics, Physics and Chemistry) - Softcover

Sikula, Josef

 
9781402021695: Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices: 151 (NATO Science Series II: Mathematics, Physics and Chemistry)
Softcover
ISBN 10: 1402021690 ISBN 13: 9781402021695
Verlag: Springer, 2008

Inhaltsangabe

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

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Reseña del editor

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

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Verlag
Springer
Erscheinungsdatum
2008
Sprache
Englisch
ISBN 10 
1402021690
ISBN 13 
9781402021695
Einband
Tapa blanda
Anzahl der Seiten
380
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Deutschland

Weitere beliebte Ausgaben desselben Titels

9781402021688: Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices: 151 (NATO Science Series II: Mathematics, Physics and Chemistry)

Vorgestellte Ausgabe

ISBN 10:  1402021682 ISBN 13:  9781402021688
Verlag: Springer, 2004
Hardcover