Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969 (Classic Reprint) - Softcover

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Excerpt from Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969

Key Words: carrier lifetime; germanium; lithium drifted gamma - ray detectors; resistivity; resistiv ity inhomogeneities; second breakdown; silicon.

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