Accelerated Life Testing of One-shot Devices: Data Collection and Analysis - Hardcover

Über die Autorin bzw. den Autor

NARAYANASWAMY BALAKRISHNAN, PhD, is Distinguished University Professor, Department of Mathematics and Statistics, McMaster University, Hamilton, Ontario, Canada.

MAN HO LING, PhD, is Associate Professor, Department of Mathematics and Information Technology, The Education University of Hong Kong, Hong Kong SAR, China.

HON YIU SO is Post-Doctoral Fellow, University of Waterloo, Waterloo, Ontario, Canada.

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PROVIDES AUTHORITATIVE GUIDANCE ON STATISTICAL ANALYSIS TECHNIQUES AND INFERENTIAL METHODS FOR ONE-SHOT DEVICE LIFE-TESTING

Estimating the reliability of one-shot devices―electro-explosive devices, fire extinguishers, automobile airbags, and other units that perform their function only once―poses unique analytical challenges to conventional approaches. Due to the nature of data collection, the precise failure times of devices cannot be obtained from tests. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected from tests.

Accelerated Life Testing of One-Shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource:

Accelerated Life Testing of One-Shot Devices is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.

Aus dem Klappentext

PROVIDES AUTHORITATIVE GUIDANCE ON STATISTICAL ANALYSIS TECHNIQUES AND INFERENTIAL METHODS FOR ONE-SHOT DEVICE LIFE-TESTING

Estimating the reliability of one-shot devices—electro-explosive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to the nature of data collection, the precise failure times of devices cannot be obtained from tests. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected from tests.

Accelerated Life Testing of One-Shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource:

Accelerated Life Testing of One-Shot Devices is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.