This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
This book explores the modern role of measurement science for both the technically most advanced applications and in everyday and will help readers gain the necessary skills to specialize their knowledge for a specific field in measurement.
Modern Measurements is divided into two parts. Part I (Fundamentals) presents a model of the modern measurement activity and the already recalled fundamental bricks. It starts with a general description that introduces these bricks and the uncertainty concept. The next chapters provide an overview of these bricks and finishes (Chapter 7) with a more general and complex model that encompasses both traditional (hard) measurements and (soft) measurements, aimed at quantifying non-physical concepts, such as quality, satisfaction, comfort, etc.
Part II (Applications) is aimed at showing how the concepts presented in Part I can be usefully applied to design and implement measurements in some very important and broad fields. The editors cover System Identification (Chapter 8), Reliability (Chapter 9) and Electromagnetic Compatibility (Chapter 10) not only for their importance in many application areas, from manufacturing to health and safety, but also because their intrinsic complexity is the perfect test bench to prove the usefulness of the concepts introduced in Part I.
Additional features to enhance readers’ understanding of measurements:
Alessandro Ferrero is a Professor at the Polytechnic University of Milan. He is a Fellow of the IEEE.
Dario Petri is a Professor at the University of Trento. He is a Fellow of the IEEE.
Paolo Carbone is a Professor at the University of Perugia. He is a Fellow of the IEEE and editor-in-chief of the international journal, ACTA IMEKO.
Marcantonio Catelani is a Professor at the University of Florence. He is a member of the IEEE and Chair of IMEKO TC10 Technical diagnostics.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.