Inhaltsangabe
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The internationally renowned authors highlight the interdependencies and trade-offs between practically important device parameters and discuss device scaling and scaling limits of CMOS and bipolar devices.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorinnen und Autoren
Yuan Taur is a Professor of Electrical and Computer Engineering at the University of California, San Diego. He spent twenty years at IBM's T. J. Watson Research Center where he won numerous invention and achievement awards. He is an IEEE Fellow, Editor-in-Chief of IEEE Electron Device Letters, and holds thirteen US patents.
Tak H. Ning is an IBM Fellow at the T. J. Watson Research Center, New York, where he has worked for over 35 years. A Fellow of the IEEE and the American Physical Society and a member of the US National Academy of Engineering, he has authored more than 120 technical papers and holds 36 US patents. He has won several awards, including the ECS 2007 Gordon E. Moore Medal, the IEEE 1991 Jack A. Morton Award and the 1998 Pan Wen-Yuan Foundation Outstanding Research Award.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Weitere beliebte Ausgaben desselben Titels
Suchergebnisse für Fundamentals of Modern VLSI Devices 2nd Edition Paperback
Internationale Ausgabe
Fundamentals Of Modern Vlsi Devices, Second Edition
Internationale AusgabeAnbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-2209
Beispielbild für diese ISBN
Fundamentals of Modern VLSI Devices
Verlag:
Cambridge University Press (edition 2), 2013
ISBN 10: 1107635713
ISBN 13: 9781107635715
Gebraucht
Paperback
Anbieter: BooksRun, Philadelphia, PA, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Good. 2. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience. Artikel-Nr. 1107635713-11-1
Beispielbild für diese ISBN
Fundamentals of Modern VLSI Devices
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-318303
Beispielbild für diese ISBN
Fundamentals of Modern VLSI Devices
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. pp. 678. Artikel-Nr. 58006203
Neu kaufen
EUR 74,70
Versand:
EUR 7,38
Von Vereinigtes Königreich nach USA
Anzahl: 1 verfügbar