MOS Interface Physics, Process and Characterization - Hardcover

Wang, Shengkai ; Wang, Xiaolei

9781032106274: MOS Interface Physics, Process and Characterization

Hardcover

ISBN 10: 1032106271 ISBN 13: 9781032106274

Verlag: CRC Press, 2021

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The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

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�ber die Autorin bzw. den Autor

Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 100 papers and authorized 40+ patents.

Xiaolei Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences in 2013 and has been engaged in Si/Ge based MOS technology. He has published more than 100 papers.

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Verlag: CRC Press
Erscheinungsdatum: 2021
Sprache: Englisch
ISBN 10: 1032106271
ISBN 13: 9781032106274
Einband: Gebundene Ausgabe
Anzahl der Seiten: 174
Kontakt zum Hersteller: preigu GmbH & Co. KG
mail@preigu.de

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