Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials) - Hardcover
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Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
Verlag:
Materials Research Society, 1985
ISBN 10: 0931837111
ISBN 13: 9780931837111
Gebraucht
Hardcover
Anbieter: Redux Books, Grand Rapids, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. Very good hardcover. No DJ. Text is clean and unmarked. Covers show very minor shelf wear. Bindings tight, hinged strong.; 100% Satisfaction Guaranteed! Ships same or next business day! Artikel-Nr. 111609260027