Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach (Circuits, Devices and Systems)

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9780863417450: Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach (Circuits, Devices and Systems)
Reseña del editor:

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.

Biografía del autor:

Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.

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Sun, Yichuang (Ed.)
Verlag: The Institution of Engineering and Technology, Stevenage, UK. (2008)
ISBN 10: 0863417450 ISBN 13: 9780863417450
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Buchbeschreibung The Institution of Engineering and Technology, Stevenage, UK., 2008. Paperback. Buchzustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. Paperback with very faint bumps to some corners/edges and spine head/foot. One or two superficial scores on covers. Bookseller stamp on FEP. Pages are clean, with clear content and sound binding. ADG. Used. Artikel-Nr. 284929

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