Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
James Moyne, Enrique del Castillo, Arnon M. Hurwitz
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: Better World Books: West, Reno, NV, USA
Zustand: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Artikel-Nr. 1059149-75
Anzahl: 1 verfügbar
Anbieter: PBShop.store UK, Fairford, GLOS, Vereinigtes Königreich
HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Artikel-Nr. GB-9780849311789
Anzahl: 1 verfügbar
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Artikel-Nr. ria9780849311789_new
Anzahl: 1 verfügbar
Anbieter: moluna, Greven, Deutschland
Gebunden. Zustand: New. James Moyne, Enrique del Castillo, Arnon M. HurwitzRun-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine runs, thereby minimizing process drift, shift, and variability-and with them, costs. It. Artikel-Nr. 898898613
Anzahl: 1 verfügbar
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - Run-to-Run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine 'runs,' thereby minimizing process drift, shift, and variability and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run-to-Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control. TOC:Introduction.- What is Run-to-Run Control - Target Audience.- Purpose of this Book.- Outline.- Background.- History of the Development of Run-to-Run Control.- Developing a Run-to-Run Solution.- Developing and Deploying Run-to-Run Solutions: Integrating Control.- Run-to-Run Solution Conclusions.- Summary of Run-to-Run Development and Deployment Process.- Deploying Run-to-Run Control in a Timely and Cost Effective Manner.- Overcoming Barriers to Deployment.- Future Research and Development Issues.- References. Artikel-Nr. 9780849311789
Anzahl: 2 verfügbar
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . . Books ship from the US and Ireland. Artikel-Nr. V9780849311789
Anzahl: 1 verfügbar
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 1st edition. 348 pages. 9.00x6.00x0.75 inches. In Stock. Artikel-Nr. __0849311780
Anzahl: 1 verfügbar
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. Run-To-Run Control in Semiconductor Manufacturing | James Moyne (u. a.) | Buch | Einband - fest (Hardcover) | Englisch | 2000 | CRC Press | EAN 9780849311789 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu. Artikel-Nr. 135453781
Anzahl: 1 verfügbar
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 1st edition. 348 pages. 9.00x6.00x0.75 inches. In Stock. Artikel-Nr. x-0849311780
Anzahl: 1 verfügbar