Interfacial Properties on the Submicron Scale (Acs Symposium Series) - Hardcover

Inhaltsangabe

Frommer (IBM research division) and Overney (chemical engineering, U. of Washington) present 19 papers that evolved from the proceedings of a symposium that had the goal of bringing together an interdisciplinary group of researchers (from the fields of chemistry, physics, biology, materials, and surface sciences) to address material properties that arise at interfaces. The material addresses the topics of interfacial properties from the angles of microscopic and spectroscopic techniques, liquid and solid states, surfaces and thin films, and empirical and computational convergence. Articles describe nanomechanical properties and structure of thin films in contrast to their bulk counterparts, from both experimental and theoretical perspectives. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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