Integrates the latest theory, methodology and applications related to the design and analysis of repeated measurement. The text covers a broad range of topics, including the analysis of repeated measures design, general crossover designs, and linear and nonlinear regression models. It also contains a 3.5 IBM compatible disk, with software to implement immediately the techniques.
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Edward F. Vonesh is Technical Director of Biometrics in the Applied Statistics Center, Baxter Healthcare Corporation, Round Lake, Illinois.
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Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less. Artikel-Nr. G0824782488I3N00
Anzahl: 1 verfügbar
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Hardcover. Zustand: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less. Artikel-Nr. G0824782488I2N00
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Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABBB-141457