Advances in Degradation Modeling - Softcover

Review

From the reviews:

“The topics covered are of current interest and include accelerated life testing and degradation models. ... The volume covers a host of applications to the field, including reliability, quality control, economics and finance. The volume is well organized, structured and presented, and the chapters appear in a logical order. It contains a lot of useful information and applications. ... the volume would be a useful resource for researchers and graduate students involved in this arena.” (Technometrics, Vol. 52 (4), November, 2010)

From the Back Cover

This volume―dedicated to William Q. Meeker on the occasion of his sixtieth birthday―is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics, and finance.

Specific topics covered include:

* Accelerated testing and inference

* Step-stress testing and inference

* Nonparametric inference

* Model validity in accelerated testing

* The point process approach

* Bootstrap methods in degradation analysis

* Exact inferential methods in reliability

* Dynamic perturbed systems

* Degradation models in statistics

Advances in Degradation Modeling is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.