This book reviews nanometrological standards before proceeding to detail pitch, step height, line width, nanoparticle size, and surface roughness. Essential for users making quantitative nanoscale measurements, in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications.
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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Artikel-Nr. CX-9780750331920
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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Artikel-Nr. CX-9780750331920
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