Full Field Optical Metrology Applications (Advances in Optics, Photonics and Optoelectronics) - Hardcover

Full Field Optical Metrology and Applications

Buch. Zustand: Neu. Neuware - Full Field Optical Metrology methods and techniques have been in existence since the first interferometry experiments by Thomas Young in the 19th Century. This book introduces non-contact optical techniques based on the speckle effect in more detail. It also covers surface metrology and explores other characteristics related to the surface, such as strain, stress, vibration, contouring, and its x, y, and z displacements (coupled as vectors in 2D and 3D). In addition, the book presents modern methods for phase retrieval, optical coherence tomography (OCT), and the moiré method.The book considers theoretical fundamentals and explores a number of applications for full-field optical metrology that are known to be widely used in many areas of interest such as biomedicine, quality control, remote sensing and probing, and manufacturing design.Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full-field speckle-based metrology are the key audiences for this text.Key Features- Provides foundations on the classical subject of interferometry- Pursues several applications for full-field optical metrology that are known to be widely used in many areas of interest, such as biomedicine, quality control, remote sensing and probing, and manufacturing design- Includes a complete description of the methodology to perform 3D digital holographic/speckle interferometry and electron holography, both of which are not available in other texts. Artikel-Nr. 9780750330251

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