On the Cutting Edge of Globalization: An Inquiry into American Elites - Softcover

Rosenau, James N.; Earnest, David C.; Ferguson, Yale H.; Holsti, Ole R.

 
9780742539761: On the Cutting Edge of Globalization: An Inquiry into American Elites

Inhaltsangabe

Woefully little systematic knowledge is available about leaders who shape and sustain globalization. On the Cutting Edge of Globalization is the first systematic study to investigate elite attitudes toward the emergent structures of world affairs. Surveys of more than 1,700 American leaders before and after 9/11 yield compelling and provocative findings that depict the attitudes and activities of an important group of people who, even as they collectively influence the course of events, are not linked and coordinated in their efforts. Chock full of original data, the book's unique contribution is enhanced by an entertaining narrative explanation that casts a Cutting Edger, an Other Leader, and a Researcher in a good-natured argument about the meaning of social science inquiry and the validity of survey data. From an author group as powerful as the targets of their inquiry comes this one-of-a-kind, intriguing, and thoroughgoing analysis.

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Über die Autorin bzw. den Autor

James N. Rosenau is University Professor of International Affairs at The George Washington University. David C. Earnest is assistant professor of political science and international studies at Old Dominion University. Yale H. Ferguson is professor of political science; co-director, Center for Global Change and Governance, Rutgers University, and honorary professor, University of Salzburg. ole r. holsti is the George V. Allen Professor of International Affairs at Duke University.

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9780742539754: On the Cutting Edge of Globalization: An Inquiry into American Elites

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ISBN 10:  074253975X ISBN 13:  9780742539754
Verlag: Rowman & Littlefield, 2005
Hardcover