Because of the rapid increase in commercially available Fourier transform infrared spectrometers and computers over the past ten years, it has now become feasible to use IR spectrometry to characterize very thin films at extended interfaces. At the same time, interest in thin films has grown tremendously because of applications in microelectronics, sensors, catalysis, and nanotechnology. The Handbook of Infrared Spectroscopy of Ultrathin Films provides a practical guide to experimental methods, up-to-date theory, and considerable reference data, critical for scientists who want to measure and interpret IR spectra of ultrathin films. This authoritative volume also: Offers information needed to effectively apply IR spectroscopy to the analysis and evaluation of thin and ultrathin films on flat and rough surfaces and on powders at solid-gaseous, solid-liquid, liquid-gaseous, liquid-liquid, and solid-solid interfaces.
* Provides full discussion of theory underlying techniques
* Describes experimental methods in detail, including optimum conditions for recording spectra and the interpretation of spectra
* Gives detailed information on equipment, accessories, and techniques
* Provides IR spectroscopic data tables as appendixes, including the first compilation of published data on longitudinal frequencies of different substances
* Covers new approaches, such as Surface Enhanced IR spectroscopy (SEIR), time-resolved FTIR spectroscopy, high-resolution microspectroscopy and using synchotron radiation
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VALERI P. TOLSTOY, PhD, is Professor in the Department of Solid State Chemistry at St. Petersburg State University.
IRINA V. CHERNYSHOVA, PhD, is Professor in the Physics Department at St. Petersburg State Technical University.
VALERI A. SKRYSHEVSKY, PhD, is Professor in the Radiophysics Department at National Shevchenko University.
Because of the rapid increase in commercially available Fourier transform infrared spectrometers and computers over the past ten years, it has now become feasible to use IR spectrometry to characterize very thin films at extended interfaces. At the same time, interest in thin films has grown tremendously because of applications in microelectronics, sensors, catalysis, and nanotechnology. The Handbook of Infrared Spectroscopy of Ultrathin Films provides a practical guide to experimental methods, up-to-date theory, and considerable reference data, critical for scientists who want to measure and interpret IR spectra of ultrathin films. This authoritative volume also: Offers information needed to effectively apply IR spectroscopy to the analysis and evaluation of thin and ultrathin films on flat and rough surfaces and on powders at solid-gaseous, solid-liquid, liquid-gaseous, liquid-liquid, and solid-solid interfaces.
* Provides full discussion of theory underlying techniques
* Describes experimental methods in detail, including optimum conditions for recording spectra and the interpretation of spectra
* Gives detailed information on equipment, accessories, and techniques
* Provides IR spectroscopic data tables as appendixes, including the first compilation of published data on longitudinal frequencies of different substances
* Covers new approaches, such as Surface Enhanced IR spectroscopy (SEIR), time-resolved FTIR spectroscopy, high-resolution microspectroscopy and using synchotron radiation
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Gebunden. Zustand: New. VALERI P. TOLSTOY, PhD, is Professor in the Department of Solid State Chemistry at St. Petersburg State University.IRINA V. CHERNYSHOVA, PhD, is Professor in the Physics Department at St. Petersburg State Technical University.VALERI A. SKRYSHEVSKY, PhD, is . Artikel-Nr. 556560768
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Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - Ein maßgebliches Handbuch und Nachschlagewerk zur IR-Spektroskopie an ultradünnen Schichten auf ausgedehnten Oberflächen! Wer IR-Spektren solcher Schichten messen oder interpretieren möchte, findet hier eine Fülle praxisnaher Informationen und aktueller theoretischer Erkenntnisse sowie - nicht zuletzt - umfangreiches Datenmaterial. Instrumentelle Ausrüstung und Zubehör werden ausführlich besprochen. Berücksichtigt wurden auch die modernsten Methoden wie SEIR-Spektroskopie, zeitaufgelöste FTIR-Spektroskopie und hochauflösende Mikrospektroskopie mit Synchrotronstrahlung. Artikel-Nr. 9780471354048
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Zustand: New. pp. xxiv + 710 Illus. Artikel-Nr. 7477552
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Hardcover. Zustand: Brand New. 1st edition. 710 pages. 9.25x6.25x1.50 inches. In Stock. Artikel-Nr. __047135404X
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Zustand: New. Research of ultrathin films has attracted tremendous interest, owing to applications in microelectronics, sensors, catalysis, and nanotechnology. This handbook serves as an authoritative reference on the growing use of infrared (IR) spectrometry to characterize very thin films at extended interfaces. Num Pages: 710 pages, Illustrations. BIC Classification: TJFD; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 47. Weight in Grams: 1266. . 2003. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. Artikel-Nr. V9780471354048
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