X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.
Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.
Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application.
Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science.
An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes:
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
RON JENKINS teaches at the Inter-national Centre for Diffraction Data.
X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.
Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.
Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis--from specimen preparation to real-world industrial application.
Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists--in chemical analysis, geology, metallurgy, and materials science.
An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes:
* The history of X-ray fluorescence spectrometry--new to this edition.
* A critical review of the most useful X-ray spectrometers.
* Techniques and procedures for quantitative and qualitative analysis.
* Modern applications and industrial trends.
* X-ray spectra--new to this edition.
X-ray Fluorescence Spectrometry X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of Z-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Date, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science.
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Hardcover. Zustand: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less. Artikel-Nr. G0471299421I3N01
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Leinen. Zustand: Sehr gut. 23cm; XVIII.; 207; Gewebe (Grüner Leinen). Sprache: Englisch, Zustand: Sehr Gut eher ungelesen; Besitzerstempel; Schutzumschlag fehlt, oder es gibt keinen; * Die Photos sind original von uns erstellt worden, u.a. erkennbar an einem kleinen weißen Stück Papier im oberen Schnitt. Ab und an verwenden Suchmaschinen Verlagsphotos, bei den Portalen selbst, werden aber nur unsere Originalphotos gezeigt. Artikel-Nr. 976874
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Gebunden. Zustand: New. .much new material. For those wishing to get to grips with X-ray techniques for the first time there is no better introduction. (Talanta, Vol 52, 2000) I have no doubt that this text would prove useful to its target readership (Contemporary Physics,. Artikel-Nr. 446915806
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Hardcover. Zustand: Brand New. 2nd sub edition. 207 pages. 9.50x6.50x0.50 inches. In Stock. Artikel-Nr. x-0471299421
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Zustand: New. X-ray fluorescence spectrometry (XRF) is a method of "fingerprinting" and identifying solid and liquid samples. Written by the leading international expert in the field, this totally-revised update provides an up-to-the-minute review of the progress of XRF in the last ten years, covering history, design, application, and interpretation. Series: Chemical Analysis. Num Pages: 232 pages, bibliographies. BIC Classification: PDN; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 248 x 159 x 16. Weight in Grams: 412. . 1999. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland. Artikel-Nr. V9780471299424
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Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application.Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science.An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes:\* The history of X-ray fluorescence spectrometry-new to this edition.\* A critical review of the most useful X-ray spectrometers.\* Techniques and procedures for quantitative and qualitative analysis.\* Modern applications and industrial trends.\* X-ray spectra-new to this edition.; Mit Hilfe der Röntgenfluoreszenzspektroskopie (XRF) erhält man 'Fingerabdrücke' chemischer Substanzen. Die letzten Errungenschaften auf diesem Gebiet behandelt dieses Buch, in dessen Neuauflage auch Kapitel zur Geschichte der XRF, zum Aufbau von Röntgenspektrographen, zu Röntgenspektren und speziellen Anwendungen aufgenommen wurden. Durch den verständlichen Stil ist der Band für Neueinsteiger und erfahrene Fachleute gleichermaßen geeignet. (08/99). Artikel-Nr. 9780471299424
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