Self-Testing Vlsi Design - Hardcover

Inhaltsangabe

The present study provides a current review on the problems of self-test VLSI design. A summary is given of self-test VLSI design results that have been obtained by scientists in leading scientific centers for computer integrated circuits. Emphasis is placed on the theoretical fundamentals of designing self-test VLSI building blocks such as built-in test generators and output response analyzers. Particular attention is paid to structural design of self-test VLSI circuits; design of universal modules for self-test VLSI circuits; and examination of the VLSI circuits for signature testability. Annotation copyright Book News, Inc. Portland, Or.

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