Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements (Classic Reprint) - Softcover

Inhaltsangabe

Excerpt from Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements

The work performed during the period September 1972 to July 1973 was reported in nbs Special Publication 400-5, Semiconductor Measurement Technology: Measurement of Trans istor Scattering Parameters This special publication describes the results of the interlaboratory comparison of transistor S - parameter measurements and shows how the equiva lent circuit of the HF probe assemblies can be characterized by means of S-parameters using previously - described techniques.

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