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Computer-aided Maintenance: Methodologies and Practices (Manufacturing Systems Engineering Series, Band 5) - Hardcover

 
9780412629709: Computer-aided Maintenance: Methodologies and Practices (Manufacturing Systems Engineering Series, Band 5)
Hardcover
ISBN 10: 0412629704 ISBN 13: 9780412629709
Verlag: Springer, 1999

Inhaltsangabe

In today's business environment, reliability and maintenance drastically affect the three key elements of competitiveness - quality, cost, and product lead time. Well-maintained machines hold tolerances better, help reduce scrap and rework, and raise consistency and quality of the part in addition to cutting total production costs. Today, many factories are still performing maintenance on equipment in a reactive manner due to a lack of understanding about machine performance behaviour. To improve production efficiency, computer-aided maintenance and diagnostic methodology must be applied effectively in manufacturing. This book focuses on the fundamental principles of predictive maintenance and diagnostic engineering. In addition to covering the relevant theory, techniques and methodologies in maintenance engineering, the book also provides numerous case studies and examples illustrating the successful application of the principles and techniques outlined.

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Über die Autorin bzw. den Autor

Prof. Jay Lee is Ohio Eminent Scholar, L.W. Scott Alter Chair Professor, and Univ. Distinguished Univ. Professor at the Univ. of Cincinnati and is founding director of National Science Foundation (NSF) Industry/University Cooperative Research Center (I/UCRC) on Intelligent Maintenance Systems (IMS) (www.imscenter.net) which consists of the Univ. of Cincinnati (lead institution), the Univ. of Michigan, Missouri Univ. of S&T, and the Univ. of Texas-Austin. Since its inception in 2001, the Center has been supported by over 100 global companies. IMS was selected as the most economically impactful I/UCRC in the NSF Economic Impact Study Report in 2012 which reported that the Center has delivered to its members a combined benefit of $847.6 million in cost savings, and that the Center returned $238.30 of benefits for every $1 invested by the National Science Foundation. He was selected to be one of the 30 Visionaries in Smart Manufacturing in U.S. by SME in Jan. 2016. In addition, he is co-Founder of Predictronics (a start-up company through NSF ICorp award in 2012). In addition, his Team has won the 1st Place PHM Data Challenges five time out of nine competitions since 2008. Dr. Jay Lee also serves as a board member and vice chairman of Hon Hai Precision (Foxconn) to support Foxconn investment in the establishment of Advanced Manufacturing Science Park (WisconnValley) in WI. In addition, he serves as a senior advisor to McKinsey & Company, Member of the Global Future Council of World Economic Forum (WEF), member of Board of Governors of the Manufacturing Executive Leadership Board of Frost Sullivan, etc. Previously, he served as director for product development and manufacturing at United Technologies Research Center (UTRC) as well as program directors for a number of programs at NSF including the Engineering Research Centers Program, the Industry/University Cooperative Research Centers Program, and Materials Processing, and Manufacturing Program,etc., etc. He also served on the Board on National Research Council (NRC) Manufacturing and Engineering Design (BMAED) during 1999-2005 as well as a number of NRC Study and Assessment Panels since 1999. He is a frequently invited speaker and has delivered over 260 keynote and plenary speeches at major international conferences. He is a Fellow of ASME, SME, PHM (Prognostics and Health Management), as well as a founding fellow of International Society of Engineering Asset Management (ISEAM). He has received a number of awards including the Prognostics Innovation Award at NI Week by National Instruments in 2012, NSF Alex Schwarzkopf Technological Innovation Prize in 2014, MFPT (Machinery Failure Prevention Technology Society) Jack Frarey Award in 2014, and PICMET Medal of Excellence in 2016.

Von der hinteren Coverseite

In today's business environment, reliability and maintenance drastically affect the three key elements of competitiveness - quality, cost, and product lead time. Well-maintained machines hold tolerances better, help reduce scrap and rework, and raise consistency and quality of the part in addition to cutting total production costs. Today, many factories are still performing maintenance on equipment in a reactive manner due to a lack of understanding about machine performance behaviour. To improve production efficiency, computer-aided maintenance and diagnostic methodology must be applied effectively in manufacturing. This book focuses on the fundamental principles of predictive maintenance and diagnostic engineering. In addition to covering the relevant theory, techniques and methodologies in maintenance engineering, the book also provides numerous case studies and examples illustrating the successful application of the principles and techniques outlined.

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Verlag
Springer
Erscheinungsdatum
1999
Sprache
Englisch
ISBN 10 
0412629704
ISBN 13 
9780412629709
Einband
Gebundene Ausgabe
Anzahl der Seiten
422
Herausgeber
Lee Jay, Wang Ben
Kontakt zum Hersteller
ProductSafety@springernature.com
ProductSafety@springernature.com

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Deutschland