Fault Diagnosis of Analog Integrated Circuits: 30 (Frontiers in Electronic Testing) - Hardcover

Barua, Alok; Kabisatpathy, Prithviraj; Sinha, Satyabroto

 
9780387257426: Fault Diagnosis of Analog Integrated Circuits: 30 (Frontiers in Electronic Testing)

Inhaltsangabe

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.

Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .

Also contains problems that can be used as quiz or homework.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Reseña del editor

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.

Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .

Also contains problems that can be used as quiz or homework.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Weitere beliebte Ausgaben desselben Titels

9781441938282: Fault Diagnosis of Analog Integrated Circuits: 30 (Frontiers in Electronic Testing)

Vorgestellte Ausgabe

ISBN 10:  1441938281 ISBN 13:  9781441938282
Verlag: Springer, 2011
Softcover