Coulomb Excitations and Decays in Graphene-Related Systems - Hardcover

Chiu, Chih-Wei; Lin, Chiun-Yan; Wu, Jhao-Ying

 
9780367218614: Coulomb Excitations and Decays in Graphene-Related Systems

Inhaltsangabe

The book provides an overview of the subject under the effects of lattice symmetries, layer numbers, dimensions, stacking configurations, orbital hybridizations, intralayer and interlayer hopping integrals, spin-orbital couplings, temperatures, electron/hole dopings, electric field, and magnetic quantization.

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Über die Autorin bzw. den Autor

Chiun-Yan Lin earned a PhD in physics in 2014 at the National Cheng Kung University (NCKU), Taiwan. Since 2014, he has been a postdoctoral researcher in the Department of Physics at NCKU. His scientific interests include the field of condensed matter physics, modeling, and simulation of nanomaterials. Most of his research focuses on the electronic and optical properties of two-dimensional nanomaterials.

Jhao-Ying Wu earned a PhD in physics in 2009 at the National Cheng Kung University (Tainan, Taiwan). After that, he was a postdoctoral fellow until 2016. He became a Professor at the National Kaohsiung University of Science and Technology. His interest focuses on theoretical condensed matter physics, including the electronic and optical properties of low-dimensional systems, Coulomb excitations, and quantum transport.

Chih-Wei Chiu is an Associate Professor in the Department of Physics, National Kaohsiung Normal University, Taiwan. He earned a PhD in 2005 at the National Cheng Kung University, Taiwan. His research deals with the physical properties of graphene-related nanosystems using numerical simulations.

Ming-Fa Lin is a Distinguished Professor in the Department of Physics, National Cheng Kung University, Taiwan. He earned a PhD in physics in 1993 at the National Tsing-Hua University, Taiwan. His scientific interests focus on the essential properties of carbon-related materials and low-dimensional systems.

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9780367779634: Coulomb Excitations and Decays in Graphene-Related Systems

Vorgestellte Ausgabe

ISBN 10:  0367779633 ISBN 13:  9780367779634
Verlag: CRC Press, 2021
Softcover