Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1969 (Classic Reprint) - Softcover

Inhaltsangabe

Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1969

During this quarter no work was carried out on either the high field effects task or the deep-level studies task. Work on the former has been suspended indefinitely in order that the staff originally assigned part time to it may devote all their efforts to the wire bond evaluation task. Work on the latter will be completed before the end of this fiscal year.

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