Large Scale Integration Digital Testing: Annotated Bibliography, 1969-1978 (Classic Reprint) - Hardcover

Inhaltsangabe

Excerpt from Large Scale Integration Digital Testing: Annotated Bibliography, 1969-1978

This annotated bibliography covers articles published in the field of semiconductor device testing. The bibliography contains (1) entries divided into six economics of testing, (2) monolithic circuit testing, (3) the testing of subsystems of large scale integrated circuits such as microcomputer boards and memory arrays, (4) various test strategies used to locate a defective lsi circuit, (5) test equipment available for lsi testing, and (6) various measurement methods that may be of interest to the test engineer.

Key Words: Electronics; integrated circuit; large scale integration; memory; microprocessor; testing.

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