Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; April 1 to June 30, 1969 (Classic Reprint) - Hardcover

Bullis, W. Murray

 
9780331408737: Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; April 1 to June 30, 1969 (Classic Reprint)
Hardcover
ISBN 10: 0331408732 ISBN 13: 9780331408737
Verlag: Forgotten Books, 2017

Inhaltsangabe

Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices<br/><br/>I. An improved method for grasping the wire during a pull test was developed last quarter. Since the wire is grasped with out deformation and the bond may be pulled in any direction, this convenient method, which involves the use of a quick setting hot-melt glue, permits increased control of the test conditions. It is also possible to test single bonds.

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Verlag
Forgotten Books
Erscheinungsdatum
2017
Sprache
Englisch
ISBN 10 
0331408732
ISBN 13 
9780331408737
Einband
Gebundene Ausgabe
Anzahl der Seiten
56
Kontakt zum Hersteller
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Weitere beliebte Ausgaben desselben Titels

9780365779025: Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1970 (Classic Reprint)

Vorgestellte Ausgabe

ISBN 10:  0365779024 ISBN 13:  9780365779025
Verlag: Forgotten Books, 2018
Softcover